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BitAlyzer® BA Series

Bit Error Rate Tester

 
The Analysis Needed to Find the Source of Bit Errors

The BitAlyzer Bit Error Rate Testers BA Series are the industrys best solution to the challenging signal integrity and BER issues faced by designers verifying, characterizing, debugging, and testing sophisticated electronic and satellite communication system designs. The BitAlyzer BA Series features exceptional performance in signal generation and analysis, operational simplicity, and unmatched debugging tools to accelerate your day-to-day tasks. The most comprehensive suite of physical-layer test tools available and the intuitive user interface provide easy access to the maximum amount of information. 
 
 
 
Features & Benefits
  • Up to 1.6 Gb/s Pattern Generator/Error Detector for Fast, Accurate Characterization of Digital Communications Signaling Systems
  • PRBS or 8 Mb User-defined Patterns provide the Versatility to Debug or Verify Any Combination of Digital Signaling
  • Built-in Clock Source for Extremely Accurate Timing
  • Adjustable Amplitude, Offset, Logic Threshold, and Termination enable Signaling Variations to Stress Test Your Receiver Designs
  • Differential and Single-ended I/O ensuring Connectivity for a Variety of Communications Bus Standards
  • BitAlyzer® Error Analysis to Rapidly Understand your BER Performance Limitations, Assess Deterministic versus Random Errors, Perform Detailed Pattern-dependent Error Analysis, Perform Error Burst Analysis, and Error-free Interval Analysis
  • Eye Diagram Display with Automatic Measurements and Fast Eye Mask Testing for Quick Signal Integrity Analysis of the Device Under Test
  • ANSI Jitter Measurements (RJ, DJ, and TJ) to Measure the Impact of Random and Deterministic Jitter on the Total Jitter at BER of 10–12
  • Q-factor Measurement to Swiftly Analyze the Vertical Eye Opening in Terms of BER
  • BER Contour with Automatic Mask Creation to Measure and View the Eye Diagram Opening as a Function of BER
  • Forward Error Correction Emulation for Built-in Verification of FEC Performance on Your Communication System Design
  • Error Mapping provides you with the Debugging Support to Identify the Cause and Location of Signaling Errors 
Applications
  • Semiconductor Characterization
  • Production Eye Mask, BER, and Jitter Testing
  • Satellite Communications System Functional Testing
  • Wireless Communications System Functional Testing
  • Fiber Optic System and Component Testing
  • Forward Error Correction Evaluation
Quick Selector Guide
Model Description Max Bit Rate
BA1500 Pattern Generator and Error Analyzer 1.5 Gb/s
BA1600 Pattern Generator and Error Analyzer 1.6 Gb/s