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I-V Curves
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4200-SCS Software
The 4200-SCS software provides a unified measurement interface that guides you through complex characterization tests. With over 450 modifiable application tests, the 4200-SCS provides real-time I-V sweeps so you can understand device behavior quickly. 4200-SCS Parameter Analyzer Mainframe The 4200-SCS is a modular, fully integrated parameter analyzer that performs electrical characterization of devices, materials or processes. With nine measurement slots and a built-in low noise ground unit, you can configure it to precisely meet your test requirements or budget constraint. Medium Power SMU Modules A Source Measure Unit (SMU) can source current or voltage and measure current and voltage with high resolution and accuracy. Each 2 W medium power SMU occupies one instrument slot and up to a total of nine can be installed in the 4200-SCS. The SMU can supply voltage/current and measure voltage/current from 100 fA to 100 mA and from 1 uV to 210 V. A preamplifier can be added to any SMU to extend the current range to 0.1 fA resolution. High Power SMU Modules A Source Measure Unit (SMU) can source current or voltage and measure current and voltage with high resolution and accuracy. Each 20W high power SMU occupies one instrument slot and up to a total of nine can be installed in the 4200-SCS. The SMU can supply voltage/ current and measure voltage/current from 100 fA to 1 A and from 1 uV to 210 V. A preamplifier can be added to any SMU to extend the current range to 0.1 fA resolution. Preamplifier Unit The low current measurement capabilities of any SMU can be extended to 0.1 fA by adding an optional preamplifier. The 4200-PA can be mounted on the back of the 4200-SCS or in a remote location such as the prober platen or light-tight enclosure to eliminate problems due to long cables. Probe Station The 4200-SCS can control external equipment such as an automated or semi-automated probe stations, temperature controllers etc. Probe drivers are supplied with the 4200-SCS for select Cascade Microtech, Suss, MicroManipulator and Signatone probe stations. Device Under Test (DUT) The 4200-SCS is capable of testing many devices or materials:
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