INSTRUEMENT PRODUCTS

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Model 4200A-SCS-PK1

High Resolution IV Bundled Characterization Solution

 
The Model 4200A-SCS-PK1 High Resolution IV Bundled Characterization Solution offers 210V/100mA and 0.1fA resolution for two- and three-terminal devices, MOSFET, CMOS characterization. It consists of the Model 4200A-SCS Parameter Analyzer, KTEI test software, two Model 4200-SMU modules, a Model 4200-PA preamp, a test fixture with sample devices, and cables.