Increasing device complexity and technology convergence are driving test systems to become more flexible, while cost pressures are demanding longer system lifetimes. A software-defined, modular architecture is the only way to accomplish these objectives. Modular instrumentation uses shared components, high-speed buses, and open, user-defined software to meet the needs of automated test equipment (ATE) today and in the future.
Series |
-Data Acquisition
Series |
Channel |
Resolution |
Sampling Rate |
|
Basic |
Up to 32 ch |
Up to 16-bit |
Up to 250 kS/s |
More detail |
High Speed |
Up to 32 ch |
Up to 16-bit |
Up to 1.25-2 MS/s |
More detail |
Simultaneous |
Up to 8 ch |
Up to 16-bit |
Up to 4 MS/s/ch |
More detail |
High Accuracy |
Up to 32 ch |
Up to 18-bit |
Up to 500 ks/s |
More detail |
-High Speed Digitizer
Series |
Channels |
Resolution |
Bandwidth |
Sampling Rate |
|
High-Speed |
2 |
Up to 12-bit |
5 GHz |
Up to 12.5 GS/s |
More detail |
High-Resolution |
2 |
Up to 24-bit |
Up to 150 MHz |
Up to 200 MS/s |
More detail |
High-Density |
8 |
Up to 12-bit |
60 MHz |
Up to 60 MS/s |
More detail |
Low-Cost |
2 |
Up to 8-bit |
125 MHz |
Up to 250 MS/s |
More detail |
-Digital Multimeters
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