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Designed as an Ultra Fast Open / Short / Diode Drop tester for semi-con industry, where production testing of high pin count devices are involved and test time is critical. High speed testing at 2 seconds for 2 million test combinations. Can be interfaced to any type of test fixtures Multi-Site Test support for Strip or Multiple device test. 16 Opto Isolated digital outputs for handler interface, binning and PASS FAIL indicators. 16 Opto Isolated Digital Inputs for Operator console and handler interface. Opto Isolated Digital I/Os are fully programmable for timing compliance of various handlers. Fast turnaround time to test new products.
| Features |
Panther II is a new generation Open / Short tester applied for Semiconductor Industry with whole new fleet of features that makes the task reliable, complete and fast. It uses Force Current - Measure voltage to test opens, shorts, leaks and diode drops.
It uses the Learn from a Known Good Board and test against target device technique.This reduces the time required to generate, otherwise, tedious test program generation.
Typical test time for a 500 pin BGA device in both forward and reverse bias conditions with 5 band comparators, is estimated to be about 0.25 second test time. Its hardware compare makes instant PASS / FAIL resilts with very less software overhead time for display and data log.
Optional Hardware can be ordered and configure for:
• In-Circuit Measurement of RLC values using 4/6 wire Kelvin measurements.
• VI-Trace,
• A/c Stimulus for contact less open / short test.
• RAM based PMU for Force Voltage - Measure Current OR Force Current - Measure Voltage. |
| Standard Panther II |
• It uses an ultra fast programmable current source.
• The current is programmable from as low as few micro amps to 50 milli amps in three ranges and
13-bit resolution.
• The voltage compliance (Voltage Clamp) is also programmable within between -2V and +7V in
13-bit resolution
• The time base is programmable from 1µs per test to 256µs per test in steps of 1µs. The time base can
be 1µs, 2µs, 3µs, 4µs etc upto 256µs. Programmable wait states per test pair pin is from zero to 255
wait states. A time base selection of 2µs and wait state selection of zero, gives 2µs test time. Wait
state selection of 1 gives 4µs test time, wait state of 2 gives 6µs and this is programmable for each
test combination individually
• This means each test combination can have its own wait states allowing longer settling time for some
pin pairs where required and default zero wait states for other pin pairs to maximize the test time as whole
• Wherever possible, we select products made from environmentally sustainable timber or better still
from rubberwood, which is a natural by-product of the rubber production process. We communicate
and promote the environmental credentials of such products to our customers.
• Panther II has four comparators with their thresholds fully programmable in 13-bit resolution within 5v
range and produces a 4-bit test result code for each test combination |
| Programmable Hardware Comparators |
• Panther II has four comparators with their thresholds fully programmable in 13-bit resolution within 5v
range and produces a 4-bit test result code for each test combination.
• The user can choose to use one comparator for simple open / short application (2 band, 1 bit test
result code), 2 comparators for open / diode (0.6v) / short classification (3 band, 2 bit test result
code), 3 comparators for open / high impedance or 1.2v diode/ diode (0.6v) / short (four band, 3 bit
test result code) or even four comparators for open / high impedance or 1.2v diode / diode (0.6v) /
near short or diode (0.3v) / short (5 band, 4bit test result code) classifications.
• Five-band comparison gives maximum information in a single test and allows device grading and checks
out devices at threshold and pin-to-pin leakages that a normal OS tester cannot detect or require
multiple tests with different thresholds.
• Panther II utilizes full hardware comparison so as to achieve fastest time for test.
• It can accept open / short data entered by operator or a net-list import or can Learn from a known
Golden Device.
• By utilizing hardware compare the Go - NoGo test time is just the hardware drive time and it is the
fastest.
• For a full failure analysis (FA) it can give the complete failure information for up to 4 Mega test
combinations from its acquisition RAM.It also has the facility to store the first 8192 failures for an
optimum Test and FA information retrieval Time.
• Panther II uses 4-wire measurement using fast analog switches for accurate voltage measurements
and improves accuracy.
• Each Mux card holds 256 channels with 4-wire measurement capability.
• Maximum of 8 MUX cards allowing 2048 channel system. |
| Multiple Test Techniques |
Mode 1 : Serial Shift Method
In this mode, one pin at a time is connected to a current source and all other pins are connected to GND. No. of Test combinations in this mode is the same as the number of pins on the device. For a 208 pin device, no. of tests are 208.
Mode 2 : Fixed Reference Method
In this mode, one pin at a time is connected to a current source and all other pins are connected to GND. No. of Test combinations in this mode is the same as the number of pins on the device. For a 208 pin device, no. of tests are 208.
Mode 3 : Half QSM Method - n*(n-1)/2 combinations
In this mode, all combinations of pins are tested as pair by pair excluding reverse combinations. Same pin as reference pin and test pin combination is skipped. Example, Pin 1 as ref and pin 2 to n are test pins, then pin 2 as ref, pins 3 to n as test pins. The no. of test combinations for this method with 2048 channels are 2 Mega combinations.
Mode 4 : Full QSM Method - n*(n-1) combinations
In this mode, all combinations of pins are tested as pair by pair including the reverse combinations. Example, Pin 1 as ref and pin 1 to n are test pins, then pin 2 as ref and pins 1 to n as test pins (Same pin as reference pin and test pin combination is skipped). Thus in this mode both normal and reverse polarity combinations are tested automatically. No. of test combinations for 2048 channels will be 4 Mega combinations.
Mode 5 : Ram Based select sequences
In this mode, the required test pin / reference pin addresses have to be filled in the RAM and the tester does only those combinations. The designed capacity for RAM based sequences are 4 MEGA combinations. |
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