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Increasing device complexity and technology convergence are driving test systems to become more flexible, while cost pressures are demanding longer system lifetimes. A software-defined, modular architecture is the only way to accomplish these objectives. Modular instrumentation uses shared components, high-speed buses, and open, user-defined software to meet the needs of automated test equipment (ATE) today and in the future.

-Data Acquisition 
Series Channel Resolution Sampling Rate  
Basic Up to 32 ch Up to 16-bit Up to 250 kS/s More detail
High Speed Up to 32 ch Up to 16-bit Up to 1.25-2 MS/s More detail
Simultaneous Up to 8 ch Up to 16-bit Up to 4 MS/s/ch More detail
High Accuracy Up to 32 ch Up to 18-bit Up to 500 ks/s More detail

-High Speed Digitizer 
Series Channels Resolution Bandwidth Sampling Rate  
High-Speed 2 Up to 12-bit 5 GHz Up to 12.5 GS/s More detail
High-Resolution 2 Up to 24-bit Up to 150 MHz Up to 200 MS/s More detail
High-Density 8 Up to 12-bit 60 MHz Up to 60 MS/s More detail
Low-Cost 2 Up to 8-bit 125 MHz Up to 250 MS/s More detail

-Digital Multimeters 
Model Digits A/C Volts D/C Volts  
NI PXI-4022 -- 250 V 250 V More detail
NI PXI-4065 6.5 300 V 300 V More detail
NI PXI-4070 6.5 250 V 300 V More detail
NI PXI-4071 7.5 700 V 1000 V More detail
NI PXI-4072 6.5 300 V 300 V More detail