Simplified Pulsed/DC I/V Characterization of LEDs
The 2601B-PULSE's unique current pulsing, DC voltage, and current capabilities enable high speed LED DC and Pulsed IV characterization and production test with 0.015% basic measure accuracy. Pulse testing a microLED, LED, or high brightness LED (HBLED) minimizes self-heating and reduces the negative impact on measurement accuracy, as well as eliminates the worries about damaging the device under test.
- - Programmable current source up to 10 A and 10 µs pulse widths
- - Voltage and current measure resolution at 100 nV and 100 fA
- - 1 Megasample/second digitizers for fast source and measure data collection
- - Built-in TSP processing capability reduces PC-instrument bus communication
On Wafer Semiconductor Testing
Keithley’s 2601B-PULSE and other Series 2600B System SourceMeter® SMU instruments combine the scalability and flexibility of rack-and-stack instruments with the integration and high throughput of mainframe-based systems, using TSP and TSP-Link technologies to reduce manufacturing footprint and cost of test. These instruments are routinely used in on-wafer semiconductor testing of laser diodes, LEDs, transistors, and so much more.
- - Built-in TSP processing capability reduces PC-instrument bus communication
- - TSP-Link up to 32 instruments at 500 ns synchronization with other Keithley TSP instruments
