Keithley Model 8020 High Power Interface Panel improves connectivity and simplifies complex measurements like high voltage capacitance-voltage (C-V) measurements. The Model 8020 reduces set-up times, minimizes opportunities for connection errors, improves operator and test hardware protection, and increases users confidence in the accuracy of their results. The Model 8020 High Power Interface Panel complements Keithley's Parametric Curve Tracer Configurations, making it the best solution for wafer level testing of high power semiconductor devices.
Watch a short introductory video to learn how the Model 8020 High Power Interface Panel can solve your high power connection dilemma.
The configurable Model 8020 High Power Interface Panel allows test engineers who are configuring high power semiconductor test systems to select the options that match their system’s probe station, positioners, or fixture. It also improves safety for both users and any low power SMU instruments in the system, simplifies incorporating different combinations of instruments, as well as taking the confusion out of adding elements like series resistors and bias tees to the signal path.
The Model 8020 simplifies changing from one measurement type to the next by allowing test engineers to connect all measurement instruments to it at once, making further connection changes unnecessary. When the Model 8020 is configured with optional C-V bias tees on the system’s 3kV and 200V channels, it acts as a high performance I-V/C-V switch, allowing users to perform both I-V and C-V testing without re-cabling.
The Model 8020 provides input connections for Keithley Model 2657A (3kV) and 2651A (50A) High Power SourceMeter SMU instruments, Model 2636B and 2612B SourceMeter SMU instruments, and Model PCT-CVU Multi-frequency C-V Meter. Various user-configurable output connectors are available to accommodate almost any probe station.
